Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram
نویسندگان
چکیده
منابع مشابه
Efficient sampling for three-dimensional atom probe microscopy data.
The best calculation of concentration profiles, isoconcentration surfaces or Gibbsian interfacial excesses from three-dimensional atom-probe microscopy data requires a compromise between spatial positioning error and statistical sampling error. For example, sampling from larger spatial regions decreases the statistical error, but increases the error in spatial positioning. Finding the appropria...
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A bainitic microstructure with fine ferrite plates (20 to 40 nm) in a matrix of high-carbon retained austenite, obtained by isothermal transformation at 200°C, was characterized with an energy-compensated optical position-sensitive three-dimensional atom probe. The average carbon concentration in the austenite was found to be 8.0±1.6 at.% and in the bainitic ferrite 1.1±0.7 at.%. The latter con...
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Trace element additions in age hardening aluminum alloys often modify precipitation products and kinetics. In the case of Al-Cu alloy, combined addition of trace amount of Mg and Ag leads to precipitation of fine and uniform dispersions of plate-like Ω phase on the {111}Al planes in addition to the θ′ precipitates on the {001}Al planes [1,2]. The Ω phase shows high thermal stability and resista...
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The statistical techniques that have been applied for presenting and analyzing atom probe data are critiqued. These techniques include raw data analysis, character plots, ladder diagrams, frequency distributions of composition profiles, Markov chains, contingency tables, cross correlations, power spectrum, and autocorrelations. A comparison of the suitability of the individual techniques for sp...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2000
ISSN: 1431-9276,1435-8115
DOI: 10.1007/s100050010051